Enhanced observation, durability and operational performance, combined with improved functionality between the microscope and digital cameras provide ideal imaging
ECLIPSE L300ND
ECLIPSE L200ND
ECLIPSE L300ND
ECLIPSE L200ND
Brightfield observation of wafer pattern
Darkfield observation
DIC observation
Epi-fluorescence observation of organic substance on wafer
From left, CFI60-2 objective, CF & IC objective
Fly-eye lens
NIS-Elements operational panel(monitor images are simulated.)