Enhanced observation, durability and operational performance, combined with improved functionality between the microscope and digital cameras provide ideal imaging
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ECLIPSE L300ND
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ECLIPSE L200ND
ECLIPSE L300ND
ECLIPSE L200ND
Brightfield observation of wafer pattern
Darkfield observation
DIC observation
Epi-fluorescence observation of organic substance on wafer
From left, CFI60-2 objective, CF & IC objective
Fly-eye lens
NIS-Elements operational panel(monitor images are simulated.)