산업 현미경

MA200
산업 현미경 > MA200

L300/200 LV150N LV100ND MA200 MA100N

ECLIPSE MA200

Nikon's very own solution for an ideal microscope
Front Operation
All controls are on the front of the instrument.
Delivers ease-of-use by placing all important controls on the front.

Automatically detects the address of the objective lens currently in use and displays it on the main unit front panel.

Compact Built-in Design
Employs internal turrets that keep dust off the illumination filters, maintaining bright uniform illumination. Also, the power supply is built in to save space.
Quick Status Check
The observation position of the objective lens and sample can be checked easily from the microscope's front panel.
Single-action Operation
Analyzer/polarizer interlock mechanism
Links the attachment and release of the analyzer/polarizer.
Brightfield/darkfield auto-aperture switching
The field stop and aperture stop automatically open when switched from brightfield to darkfield. When returning to brightfield observation, the previous field and aperture stop settings are reproduced.
Flash prevention mechanism
Automatically prevents reflection flashes when switching objective lenses
Box Structure
Smaller footprint than conventional models:
One third of the space of conventional models
Improved durability thanks to the unique box structure.
Links the attachment and release of the analyzer/polarizer.
Compact Structure with a Depth of 315 mm
A box shaped microscope, in which not only the width but also the depth is reduced dramatically: The footprint is only one-third of a conventional model!
High Stability/Durability
Vibration during high-power observation is reduced. Extremely high rigidity.
High Performance
Basic performance dramatically improved. Provides a more ergonomic and clear image observation.
Super-wide Field of View
The ultra wide field of view eyepiece, in combination with the newly developed 1x objective lens, enables a sample of 25 mm in diameter to be observed in one field of view.
Even Illumination
Improved uniformity of illumination delivers clear images, especially for digital imaging
Even Illumination
Improved uniformity of illumination delivers clear images, especially for digital imaging

Brightfield

DIC

Brightfield

Simple Polarizing

Image Capture
DS-L4 camera control unit (Stand-alone type)
The built-in, high-definition, 10.1-inch WU XGA LCD screen lets you view and discuss the sample without the need to look in the eyepieces.
Easily Save/Print Data
Captured images can be saved to USB memory or a CF card. In addition to printing directly via a PictBridge-compatible printer, you can save data onto a server over a LAN.
Status Display (MA200 only)
The calibration data is automatically changed when the objective magnification is changed. This feature makes it easy to use the measurement function in the DS-L4. Quantitative illumination adjustment can be made manually by viewing the voltage value. This is crucial when acquiring the optimum settings for observation and image capture.
Image Analysis
NIS-Elements allow the user to perform everything from basic image capture to the measurement, analysis, and management of captured images.
*See the NIS-Elements catalog for more information.
Status Display (MA200 only)
The calibration data is automatically changed when the objective magnification is changed. This feature makes the measurement function and other optional software modules such as grain sizing and cast iron analysis in the NIS-Elements easy to use.
Quantitative illumination adjustment, which is crucial when acquiring the optimum settings for observation, image capture and especially large image stitching, can be made via PC control.
Stitching
Adjacent images can be put together to create an image with a wide field. It is now possible to capture even more vivid images due to the improved uniformity of the illumination.
Grain Size Analysis (Option)
Detects and measures grains in one and two phase samples according to JIS G0551 or ASTM E112-96/E1382-97 standards.
Cast Iron Analysis (Option)
Detects, measures and classifies graphite content as well as ferrite content in graphite-corrected samples according to JIS G5502 or ASTM A247-06 standards.
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